JPH031448U - - Google Patents
Info
- Publication number
- JPH031448U JPH031448U JP5845789U JP5845789U JPH031448U JP H031448 U JPH031448 U JP H031448U JP 5845789 U JP5845789 U JP 5845789U JP 5845789 U JP5845789 U JP 5845789U JP H031448 U JPH031448 U JP H031448U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor substrate
- junction
- filter
- layer
- junctions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Landscapes
- Solid State Image Pick-Up Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5845789U JPH031448U (en]) | 1989-05-19 | 1989-05-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5845789U JPH031448U (en]) | 1989-05-19 | 1989-05-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH031448U true JPH031448U (en]) | 1991-01-09 |
Family
ID=31584084
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5845789U Pending JPH031448U (en]) | 1989-05-19 | 1989-05-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH031448U (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002319697A (ja) * | 2001-04-23 | 2002-10-31 | Seiko Instruments Inc | 光センサ及びその検査方法 |
-
1989
- 1989-05-19 JP JP5845789U patent/JPH031448U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002319697A (ja) * | 2001-04-23 | 2002-10-31 | Seiko Instruments Inc | 光センサ及びその検査方法 |
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